Temperature-Dependent Current–Voltage Characterization of Solar Cells

During this practical, you will investigate how temperature influences the electrical performance of a silicon solar cell by measuring its current density–voltage (J–V) characteristics under different temperature conditions.

Figure 1. The experimental setup for temperature-dependent J-V characterization

As shown in Figure 1, you will use a heater to have temperature-control and a solar simulator to perform systematic J–V measurements over a defined temperature range. The aim is to analyze the temperature dependence of key photovoltaic parameters (open-circuit voltage (Voc), short-circuit current (Jsc), fill factor (FF), efficiency) and to understand underlying loss mechanisms such as recombination pathways and series resistance effects.

You Will ...

  1. Calibrate the illumination intensity at room temperature to approximate standard test conditions.
  2. Measure baseline J–V curves of the silicon solar cell at room temperature in both dark and illuminated conditions.
  3. Vary temperature stepwise, allowing thermal equilibrium at each point
  4. Record J–V curves at each temperature and extract key solar cell parameters
  5. Plot results to show the dependence of Voc​, Isc​, and efficiency on temperature.
  6. Analyze trends to observe how Voc and Jsc​ typically changes and evaluate the combined impact on efficiency

Detailed experimental Work

  1. Verify solar simulator intensity at room temperature. Calibrate temperature and confirm stable control over the entire measurement range.
  2. Perform J–V measurements at multiple temperatures.
  3. Measure dark current.

Data Analysis: Plot Voc vs. T and Jsc vs T. Fit to extract bandgap and recombination activation energy. Analyze series resistance and shunt resistance temperature trends.

You Will Learn ...

• How temperature affects solar cell parameters and efficiency.

• The relationship between Voc and intrinsic material properties such as bandgap.

• How to distinguish recombination-limited vs. resistive losses from temperature-dependent data.

• Best practices for thermal control and avoiding measurement artifacts.